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Автор: Tibor Grasser
Название: Hot Carrier Degradation in Semiconductor Devices
Издательство: Springer
Год: 2015
Формат: PDF
Страниц: 517
Размер: 21.4 MB
Язык: Английский
ISBN: 3319089935
Для сайта: MirKnig.com
This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.
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