Hot Carrier Degradation in Semiconductor Devices

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Автор: Tibor Grasser

Название: Hot Carrier Degradation in Semiconductor Devices

Издательство: Springer

Год: 2015

Формат: PDF

Страниц: 517

Размер: 21.4 MB

Язык: Английский

ISBN: 3319089935

Для сайта: MirKnig.com

This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.

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