Thoughtful Machine Learning: A Test-Driven Approach

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Название: Thoughtful Machine Learning: A Test-Driven Approach

Автор: Matthew Kirk

Издательство: O’Reilly Media

ISBN: 978-1-44937-406-8

Год: 2014

Количество страниц: 236

Формат: PDF

Язык: English

Размер: 6.7 Мб

Learn how to apply test-driven development (TDD) to machine-learning algorithms—and catch mistakes that could sink your analysis. In this practical guide, author Matthew Kirk takes you through the principles of TDD and machine learning, and shows you how to apply TDD to several machine-learning algorithms, including Naive Bayesian classifiers and Neural Networks.

Machine-learning algorithms often have tests baked in, but they can’t account for human errors in coding. Rather than blindly rely on machine-learning results as many researchers have, you can mitigate the risk of errors with TDD and write clean, stable machine-learning code. If you’re familiar with Ruby 2.1, you’re ready to start.

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